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A multichannel reflectance anisotropy spectrometer for epitaxial growth monitoring. Reflectance-difference spectroscopy as a probe for semiconductor epitaxial growth monitoring.

Real-time reflectance-difference spectroscopy of GaAs molecular beam epitaxy homoepitaxial growth. A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub- second time resolution. Ortega- Gallegos, "Simulating Crystal Growth in GPU Parallel Machines", (en proceso de publicación en las memorias de: ISUM 2010, Transforming Research through High Performance Computing, Guadalajara, Jalisco.) Lastras-Martínez, "Dots-in-a-Well InGaAs Based Laser Probed by Photoreflectance-Anisotropy Spectroscopy", III Conference of University of Guanajuato, IEEE. Journal of the Optical Society of America B, Vol. "One electron and discrete excitonic contributions to the optical response of semiconductors around E1 transition: analysis in the reciprocal space". "Reflectance- Difference Spectroscopy as an optical probe for in situ determination of doping levels in GaAs". Cardona "Surface strain contributions to the lineshapes of reflectance difference spectra for one-electron and discrete-exciton transitions ". Balderas-Navarro "Optical Anisotropy induced by Mechanical Strain around the Fundamental Gap of GaAs". Balderas-Navarro "Reflectance-Anisotropy study of the dynamics of Molecular Beam Epitaxy growth of GaAs and InGaAs on GaAs (001)". Gutiérrez-Vega, Josué Dávila-Rodríguez, Carlos López-Mariscal, Proc. Sixth Symposium Optics in Industry, edited by Julio C. Lastras-Martínez, "Reflectance-difference Spectroscopy as an optical probe for the in situ determination of doping levels in GaAs".

Lastras-Martínez, "Reflectance Difference Spectroscopy as an optical probe for the in situ determination of doping levels in GaAs", MEP 2006, 7-11 November 2006, Guanajuato, Guanajuato, México.Ī. Lastras Martínez "Giant reflectance anisotropy of polar cubic semiconductors in the far infrared". San Luís Potosíĭoctorado en Ciencias Aplicadas con especialidad en Fotónica. 2003-2008 Instituto de Investigación en Comunicación Optica, UASLP. Maestría en Ciencias Aplicadas con especialidad en Fotónica. Educación Profesional en Ingeniería Mecánica 1998-2002.